EC6005 - ELECTRONIC TESTING (Syllabus) 2013-regulation Anna University
EC6005 | ELECTRONIC TESTING | LPTC |
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3003
OBJECTIVES:
• To understand the basics of testing and the testing equipments
• To understand the different testing methods
• To understand the different testing methods
UNIT I | INTRODUCTION | 9 |
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Test process and automatic test equipment, test economics and product quality, fault modeling
UNIT II | DIGITAL TESTING | 9 |
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Logic and fault simulation, testability measures, combinational and sequential circuit test generation.
UNIT III | ANALOG TESTING | 9 |
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Memory Test, DSP Based Analog and Mixed Signal Test, Model based analog and mixed signal test, delay test, IIDQ test.
UNIT IV | DESIGN FOR TESTABILITY | 9 |
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Built-in self-test, Scan chain design, Random Logic BIST, Memory BIST, Boundary scan test standard, Analog test bus, Functional Microprocessor Test, Fault Dictionary, Diagnostic Tree, Testable System Design, Core Based Design and Test Wrapper Design, Test design for SOCs
UNIT V | LOADED BOARD TESTING | 9 |
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Unpowered short circuit tests, unpowered analog tests, Powered in-circuit analog, digital and mixed signal tests, optical and X-ray inspection procedures, functional block level design of in-circuit test equipment
TOTAL : 45 PERIODS
OUTCOMES: Upon completion of the course, students
• Explain different testing equipments.
• Design the different testing schemes for a circuit.
• Discuss the need for test process
• Design the different testing schemes for a circuit.
• Discuss the need for test process
TEXT BOOK:
1. Michael L. Bushnell and Vishwani D. Agarwal, “Essentials of Electronic Testing for Digital, Memory & Mixed-Signal VLSI Circuits”, Springer, 2006.
REFERENCE
1. Dimitris Gizopouilos , “Advances in Electronic Testing” , Springer 2006.
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