OML552 Syllabus - Microscopy - 2017 Regulation - Open Elective | Anna University

OML552 Syllabus - Microscopy - 2017 Regulation - Open Elective | Anna University

OML552

MICROSCOPY

 L T P C

3003

OBJECTIVE:
This course will cover the basic principles and techniques of optical and electron microscopy.
This course also deals with the sample preparation techniques for the microstructural analysis.

UNIT I

INTRODUCTION

9

History of Microscopy, Overview of current microscopy techniques. Light as particles and waves, Fundamental of optics: Diffraction and interference in image formation, real and virtual images, Resolution, Depth of field and focus, Magnification, Numerical aperture, Aberration of lenses. Components of Light Microscopy, Compound light microscopy and its variations.

UNIT II

MICROSCOPY

9

Phase contrast microscopy: optical design, theory, image interpretation, Dark-field microscopy: optical design, theory , image interpretation, Polarization Microscopy: Polarized light, optical design, theory , image interpretation, Differential Interference Contrast (DIC): equipment and optics, image interpretation, Modulation contrast microscopy: contrast methods using oblique illumination.


UNIT III

ELECTRON MICROSCOPY

9

Interaction of electrons with matter, elastic and inelastic scattering, secondary effects, Components of electron microscopy: Electron sources, pumps and holders, lenses, apertures, and resolution. Scanning Electron and Transmission Electron Microscopy: Principle, construction, applications and limitations.

UNIT IV

SAMPLE PREPARATION FOR MICROSTRUCTURAL ANALYSIS

9

Optical Microscopy sample preparation: Grinding, polishing and etching, SEM sample preparation: size constrains, TEM sample preparation: Disk preparation, electro polishing, ion milling, lithography, storing specimens.

UNIT V

CHEMICAL ANALYSIS

9

Surface chemical composition (Principle and applications) - Mass spectroscopy and X-ray emission spectroscopy - Energy Dispersive Spectroscopy- Wave Dispersive Spectroscopy. Electron spectroscopy for chemical analysis (ESCA), Ultraviolet Photo Electron Spectroscopy (UPS), X ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES)- Applications.

TOTAL: 45 PERIODS

OUTCOMES:
Able to understand the physics behind the microscopy.
Ability to describe the principle, construction and working of light microscopy.
Ability to appreciate about electron microscopy.
Ability to understand about the important of sample preparation technique.
Ability to identify the appropriate spectroscopy technique for chemical analysis.

TEXT BOOKS:
1. Douglas B. Murphy, Fundamentals of light microscopy and electronic imaging, 2001, WileyLiss, Inc. USA
2. David B. Williams and C. Barry Carter, Transmission Electron Microscopy-A Textbook for Materials Science, Springer US, 2nd edition, 2009.

REFERENCES:
1. Brandon D. G, “Modern Techniques in Metallography”, Von Nostrand Inc. NJ, USA,1986.
2. Whan R E (Ed), ASM Handbook, Volume 10, Materials Characterisation“, Nineth Edition, ASM international, USA, 1986.
3. Thomas G., “Transmission electron microscopy of metals”, John Wiley, 1996

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